Last edited by Tejar
Wednesday, July 8, 2020 | History

6 edition of Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices found in the catalog.

Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices

by Evgeni Gusev

  • 356 Want to read
  • 28 Currently reading

Published by Springer .
Written in English

    Subjects:
  • Semi-conductors & super-conductors,
  • Technology,
  • Engineering - Electrical & Electronic,
  • Technology & Industrial Arts,
  • Science/Mathematics,
  • Electronics - Microelectronics,
  • Material Science,
  • Technology / Engineering / Electrical,
  • Technology-Electronics - General,
  • Technology-Material Science

  • Edition Notes

    NATO Science Series II: Mathematics, Physics and Chemistry

    The Physical Object
    FormatPaperback
    Number of Pages492
    ID Numbers
    Open LibraryOL8371839M
    ISBN 10140204366X
    ISBN 109781402043666


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Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices by Evgeni Gusev Download PDF EPUB FB2

Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-K Dielectric Nano-Electronic Semiconductor Devices, St. Petersburg, Russia, from 11. Evgeni Gusev: free download. Ebooks library. On-line books store on Z-Library | B–OK. Download books for free.

Find books. Thin Lu2O3 and Yb2O3 layers grown on Si using Atomic Layer Deposition (ALD) were studied with x-ray photoelectron spectroscopy (XPS) and low energy ion spectroscopy (LEIS).

X2 Semiconductor - $ X2 Semiconductor Diode Eda Electronic Devices Inc A25a Buy Now. For example, electrically active defects in the gate dielectric of the MOSFET are at densities (∼ 10 10 cm −2) that typically cannot be Cited by:.